TEBL LAB
PATENT
- 1US10,482,962 (May 15, 2018, November 19, 2019) Cheol Kim, Hyun-Suk Kang, Kee-Won Kwon, Rak-Joo Sung, Sung-Gi Ahn, “TCAM device and operating method thereof,”
- 2US10,395,719 (June 12, 2018, August 27, 2019) Cheol Kim, Kee-Won Kwon, Ji-Su Min, Rak-Joo Sung, Sung-gi Ahn, " Memory device driving matching lines according to priority”
- 3US 9,659,641 B2 (March 17, 2015(14/660,530) 2017-05-23) Chan-kyung Kim and Kee-won Kwon, "On-chip resistance measurement circuit and resistive memory device including the same”
- 4US 9,548,114(October 31, 2013(14/068,382) 2017/1/17) Jong-Min Baek, Dong-Jin Seo, Kee-Won Kwon, “Resistive semiconductor memory capable of performing incremental step pulse programming (ISPP) based on digital code values of memory cells”
- 5US 9,424,916 (June 26, 2017(14/109,109) 2016/8/23) Keewon Kwon, Jongmin Baek, Dongjin Seo, "Semiconductor memory device and method for reading the same using a memory cell array including resistive memory cells to perform a single read command"
- 1US9385730 B2 (2014- 5- 8, 2016-7-5) Junhan BAE, Kee-won Kwon, Kyoungho KIM, Jung Hoon CHUN, Youngsoo Sohn, Seok Kim, “Phase-rotating phase locked loop and method of controlling operation thereof”
- 2US9330743 B2(2015-04-03, May 3, 2016) Chan-kyung Kim, Kee-won Kwon, Su-a Kim, Chul-Woo Park, Jae-Youn Youn, “Memory cores of resistive type memory devices, resistive type memory devices and method of sensing data in the same”
- 3US 14/109,109 (Dec 17, 2013) Jong-Min Baek, Dong-Jin Seo, Kee-Won Kwon, “Semiconductor memory devices, verify read method and system”
- 4US2011/0049597 (2011. 03. 03) Ji-hong Kim and Kee-won Kwon, “Non-Volatile Memory Device”
- 5US2010/0085821 (2010. 04. 08) Seungeon Ahn, Keewon Kwon, Jaechul Park, Youngsoo Park, Myoungjae Lee, “Operation Method of Non-Volatile Memory”
- 6US2009/0283763 (2009. 11. 19) Jaechul and Keewon Kwon, “Transistors, Semiconductor Devices and Methods of Manufacturing the same”
- 7US2007/0133331 (2007. 06. 14) Duk-Ha Park, Kee Won Kwon “Device and Method for Reducing Refresh Current Consumption”
- 8US2006/0291313 (2006.12. 28) Kee-Won Kwon, “Local Sense Amplifier and Semiconductor Memory Device having the Same”
- 9US 9,548,114(Jan 17, 2017) 14/068,382 (Oct 31, 2013) Jong-Min Baek, Dong-Jin Seo, Kee-Won Kwon, “Semiconductor memory devices, verify read method and system”
- 10US8,050,087 (November 1, 2011) Ju-hee Park, Jae-wong Hyun, Kyoung-lae Cho, Yoon-dong Park, Seung-hoon Lee, Kee-won Kwon, “Non-volatile memory device and method of operating the same”
- 11US7,898,893 (March 1, 2011) Jaechul Park, Keewon Kwon, Youngsoo Park, Seunghoon Lee, Seungeon Ahn, “Multi-layered memory devices”
- 12US7,618,186 (November 17, 2009) Duk-Min Kwon, Kee-Won Kwon, “Self-Calibrating Temperature Sensors and Methods Thereof”
- 13US7,477,563 (January 13, 2009) Uk-Song Kang, Kee-Won Kwon, “Dynamic Random Access Memory Device and Associated Refresh Cycle”
- 14US7,457,181 (November 25, 2008) Hoon Lee, Kee-Won Kwon, “Memory Device and Method of Operating the Same”
- 15US7,286,415 (October 23, 2007) Kee-Won Kwon, “Semiconductor Memory Devices having Dual Port Mode and Methods of Operating the Same”
- 16US7,259,592 (August 21, 2007) Seung-Hoon Lee, Kee-Won Kwon, Jung-Hwan Choi, “Output Drivers having Adjustable Swing Widths during Test Mode Operation”
- 17US7,199,632 (April 3, 2007 ) Byung-Kwan Chun, Kee-Won Kwon, “Duty Cycle Correction Circuit for Use in a Semiconductor Device”
- 18US7,199,623 (April 3, 2007) Kee-Won Kwon, “Method and Apparatus for Providing a Power-On Reset Signal”
- 19US7,145,493 (December 05, 2006 ) Kee-Won Kwon, “Digital-to-analog converter (DAC) circuits using different currents for calibration biasing and methods of operating same”
- 1US6,980,048 (December 27, 2005 ) Kee-Won Kwon, “Voltage Generating Circuit Capable of Supplying Stable Output Voltage Regardless of External Input Voltage”
- 2US6,914,461 (July 5, 2005) Kee-Won Kwon, “Power-On Reset Circuits including first and second signal generators and related methods”
- 3US6,882,561 (April 19, 2005), Kee-Won Kwon and Su-Jin Ahn, “Semiconductor Memory Device Comprising Memory Having Active Restoration Function”
- 4US6,879,527 (April 12, 2005), Kee-Won Kwon and Youn-Cheol Kim, “Semiconductor Memory Device with Structure Providing Increased Operating Speed”
- 5US5,834,348(Nov. 10, 1998); Kee-Won Kwon and Chang-Seok Kang, “Method for manufacturing a semiconductor device having a ferroelectric capacitor”
- 6US5,796,133(Aug. 18, 1998); Kee-Won Kwon and Chang-Seok Kang, “Semiconductor device capacitor having lower electrodes separated by dielectric spacer material”
- 7US5,552,337(Dec. 30, 1997); Kee-Won Kwon and Chang-Seok Kang, “Method for manufacturing a semiconductor memory device having a tantalum oxide film”
- 8UK2,285,377(March 26, 1997); Jae-Hong Ko, Yong-Bin Sun, Kee-Won Kwon, and Chang-Seok Kang, “Semiconductor Device and a Manufacturing Method Therefor”
- 9US5,195,018(March 16, 1993); Kee-Won Kwon and Youngwuk Kim, “High dielectric constant capacitor and method for manufacturing the same”
- 1KR1686582(December 08, 2016) 유도결합 통신수단을 구비한 전자소자
- 2국가ID: ID-201402-010-1-US0
발명의 명칭: 온-칩 저항 측정 회로 및 이를 포함하는 저항성 메모리 장치
발명자: 김찬경 권기원
당소관리번호: CY2028US
- 1국가ID: ID-201311-037-1-US0
발명의 명칭: 저항성 메모리 장치의 메모리 코어, 이를 포함하는 저항성 메모리 장치 및
발명자: 김찬경 권기원 김수아 박철우 윤재윤
당소관리번호: CY2027US
- 2국가ID: ID-201402-010-1-US0
발명의 명칭: 온-칩 저항 측정 회로 및 이를 포함하는 저항성 메모리 장치
발명자: 김찬경 권기원
당소관리번호: CY2028US
- 3KR1545512 (August 12, 2015), Jong-Min Baek, Dong-Jin Seo, Kee-Won Kwon, “Semiconductor memory devices, verify read method and system” (2012-0153450, Dec 26, 2012)
- 4KR1481543 (January 06, 2015) Kee-Won Kwon, “Blind near-Baud rate receiver with adaptive equalization” (2013-0024491, March 07, 2013)
- 5KR1470520 (December 02, 2014) Kee-Won Kwon, “Spatial and temporal variability-aware memory readout” (2013-0015046, Feb 12, 2013)
- 6KR1431215 (August 11, 2014) (Jong-Min Baek, Dong-Jin Seo, Kee-Won Kwon, “Semiconductor memory devices, refresh method and system” 10-2012-0139735, Dec 04, 2012)
- 7KR1401504 (May 23, 2014) Kee-Won Kwon and June-Han Bae “Spread Spectrum Clock Generator with Hershey-Kiss Modulation Profile Using Multiple Charge Pumps (2012-156583, Dec 28, 2012)”
- 810-2011-0115363(November 07, 2011) Kee-Won Kwon and Jung-Hoon Chun, “Semiconductor Devices”
- 9KR1385637 (April 9, 2014) Kee-Won Kwon, Jong-Min Baek, Dongjin Seo, “Write scheme of non-volatile memory with adaptive write control” (2012-0122369, 20121031)
- 10KR1309399 (September 10, 2013) Jung-Hoon Chun, Seok Kim, Seung-Taek Yoo, and Kee-Won Kwon, “Supply regulation bandgap reference circuit with two bandgap cores and switch.” (10-2011-0144872, December 28, 2011)
- 11KR1305850 (September 02, 2013) Jong-Min Baek, Jung-Hoon Chun, and Kee-Won Kwon, “Dual charge pump scheme with optimizing ripple voltage and peak current” (10-2011-0106738, October 19, 2011)
- 12KR1232287 (February 5, 2013) Kee-Won Kwon, “Aligner and operating method thereof” (2011-0067281, July 07, 2011)
- 13KR1207072 (November 26, 2012) Jung-Hoon Chun, Goeun Jung, Seok Kim, Kee-Won Kwon “Phase interpolated PLL using multiple charge pumps and multiplexers and the method of the spread spectrum clock generation” (2011-0014022, February 17, 2011)
- 14KR1201116 (November 7, 2012) Jung-Hoon Chun, Seok Kim, Jae-Wook Jeon, Kee-Won Kwon “Phase Locked Loop with dynamic loop bandwidth controller”
- 15KR1165547 (July 6, 2012) Jung-Hoon Chun, Eunyoung Jin, and Kee-Won Kwon “Edge and data adaptive equalization of low power voltage mode receiver with offset cancellation scheme”
- 16KR1148596 (May 11, 2012) Seok Kim, Jung-Hoon Chun, Eun Ji Choi, Jung-Hyun Song, and Kee-Won Kwon “Voltage-Mode Tx Driver with Capacitive Coupling Equalizer”
- 17KR1040004 (June 1, 2011) Hye-Won Hwang and Kee-Won Kwon “Charge Recycling Charge Pump”
- 18KR0935936 (December 30, 2009) Jaechul Park and Kee-Won Kwon “Stacked Memory Devices”
- 19KR0903418 (June 10, 2009) Young-Chang Joo and Kee-Won Kwon “Memory Cell utilizing the Electromigration”
- 20KR0791918 (December 28, 2007) Duk-min Kwon and Kee-Won Kwon “Self-Calibrating Temperature Sensor”
- 1KR0720644 (May 15, 2007) Hoon Lee and Kee-Won Kwon “Memory Devices and Operating thereof”
- 2KR0714487 (April 26, 2007) Wooksong Kang and Kee-Won Kwon, Dynamic Memory Device and Method to Determine the Refresh Cycle”
- 3KR0666488 (January 3, 2007) Kee-Won Kwon “Local Sense Amplifier”
- 4KR0644223 (November 2, 2006) Duk-Ha Park and Kee-Won Kwon, “Device and Method for Reducing Refresh Current Consumption”
- 5KR0632474 (September 28, 2006) Kee-Won Kwon “Semiconductor Memory Devices”
- 6KR0614645 (August 14, 2006) Kee-Won Kwon “Power On Reset”
- 7KR0609265 (July 28, 2006) Kee-Won Kwon “Dual Port Memory”
- 8KR0604851 (July 19, 2006) Kee-Won Kwon, Jung-Hwan Choi, Seunghoon Lee “High Speed IO for Testability”
- 9KR0585117 (May 24, 2006) Dong-Hak Shin and Kee-Won Kwon, “Semiconductor Device having Read Dataline with Reduced Load”
- 10KR0574962 (April 24, 2006) Kee-Won Kwon “Data IO of Semiconductor Memory Devices”
- 11KR0546412 (January 19, 2006) Kee-Won Kwon “Digital-to-Analog Converter and Method of Conversion”
- 12KR0534211 (December 1, 2005) Byung-Kwan Chun and Kee-Won Kwon “Duty Cycle Correction”
- 13KR0518534 (September 26, 2005) Kee-Won Kwon and Yuncheul Kim “Semiconductor Memory Devices having Structure to improve the operating speed”
- 14KR0496863 (June 14, 2005) Kee-Won Kwon “Power-on Reset Circuit”
- 15KR0487536 (April 26, 2005) Kee-Won Kwon “Power-on Reset Circuits”
- 16KR0446297 (August 20, 2004) Kee-Won Kwon “Voltage Generating Circuits”
- 17KR0434514 (May 25, 2004) Kee-Won Kwon and Sujin Ahn “Semiconductor Memory Device having Active Restoring”
- 18KR0304689 (July 24, 2001) Kee-Won Kwon and Kyunghoon Kim “Semiconductor Capacitor Device Fabrication”
- 19KR0292402 (March 23, 2001) Kee-Won Kwon and Insung Park, “Semiconductor Fabrication Method having Plasma Ammonia Treatment”
- 20KR0269271 (July 20, 2000) Chang-Seok Kang, Taisu Park, and Kee-Won Kwon “Fabrication Method of Semiconductor Devices”
- 1KR0016244 (December 7, 1996) Kee-Won Kwon, Sung-Hoon Kang, Chang-Seok Kang, “High Density Semiconductor Capacitor Fabrication Methods”